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Abstract
Go surface 英国留学生电子科技论文 of AC plasma display panel was investigated after aging process. The surface roughness of Go film was different by regional groups due to different degree of ion bombardments. Though there was no difference in the chemical composition of them go surface before and after aging process, cathodoluminescence (CL) spectra increased as the surface roughness of Go film became smoother. This suggests that ion bombardments created the F and/or F+ centers on the MgOsurface, therefore, the CL intensity increased at the smoothed surface.

1.Introduction
After the developments of three-electrode structure using surface discharge in AC-plasma display panels (PDPs) [1], the aging process has been performed after the panel assembling to stabilize the operation of PDPs. The aging time has decreased continuously down to 7~8 hours. Many studies are focused to figure out the effect of aging discharge on the panel operations. They discussed about the importance of the surface roughness [2], carbon and water contaminations [3, 4], and cathodoluminescence spectra forgo film [5]. Though the sole effect is well explained, their relationships are not clearly identified. In this study, we analyzed the Go surface after aging process, and identified that cathodoluminescence (CL) spectra is closely connected with the surface roughness of Go film

2.Experiments
42” plasma display panels (PDPs) were fabricated by LGelectronics’ own techniques. After the aging process, PDPs were separated into front and rear plates in air and the front plates were immediately sealed with vacuum seal apparatus to protect them go films of front plates from various contaminations. The surface of Go film was analyzed by an optical microscopy (OM), a field emission scanning electron microscopy (FESEM) and an atomic force microscopy (AFM). An x-ray photoelectron spectroscopy (XPS) was used to analyze the carbon and water contaminations. The CL spectra of Go film were measured using Joel JSM-820 scanning microscope with Galan’s Mono Ecosystem. The Go film was coated with Pt film of 3.5 nmthickness to avoid electron charging during CL measurement. CLmeasurement was conducted with 3 kV acceleration voltage and5, 000 magnifications at room temperature. The ion induced secondary electron emission coefficient (if) was measured by focused ion beam (FIB) method at PDP research center ofKwangwoon university. The details of if measurement are described by Lim et al [6].

6. References
[1] T. Shined and A. Minima, "Fabrication Technologies of Plasma Display Panels" SID 1984 digest pp. 172-175 (1984).
[2] M. Noh, Y. Yi and K. Jing, “Study of the Go Surface at the Initial Stage of Aging in ac-PDP: Morphological Evolution and the Resulting Discharge Characteristics”, J.Korean Phys. Soc., Vol. 42, No. 5, pp. 631-634 (2003)
[3] J. K. Kim, K. S. Moon, K. W. Wang, and J. H. Lee,“Effects of post-treatment of Go on the discharge characteristics of an alternating current plasma display panel”, J. Vac. Sci. Technol. B Vol. 19, No. 3, pp. 687-691(2001).
[4] H. So, K. H. Lee and Y. C. Kim, “Observation of Inner Surface Change in Plasma Display Panel”, Korean Chemical Engineering Research, Vol. 40, No. 5, pp. 602-606 (2002).
[5] Y. Motoyama, Y. Hirano, K. Ishii, Y. Murakami, and Festal, “Influence of defect states on the secondary electron emission yield γ from Go s本论文由英语论文网提供整理，提供论文代写，英语论文代写，代写论文，代写英语论文，代写留学生论文，代写英文论文，留学生论文代写相关核心关键词搜索。